Features of Testing and Monitoring Optical Qualities of Dielectric Single Crystals

The article discusses the features and problems of metrological quality assurance of measure- ments of parameters of optical single-crystal materials and elements made of them using examples of measurements of parameters of dielectric ionic optical materials from the practice of the interdepartmental educational and testing laboratory of semiconductor materials and dielectrics «Single crystals and blanks stock on their base» of NUST MISIS.

It has been established that the properties of grown crystals can be adjusted by exposing numerous structural point defects, which control the properties of the crystals, to external influences. Evidence is provided that the approach «structure – structure defects – properties – application of defects to control properties – ad- justment of crystal production technology» is the most effective for studying the physical parameters of dielectric crystals.

The article contains a summary of information from regulatory documents, original articles, reviews and monographs on the problems of metrological assurance in the field of solid state physics. The material is based on the results of the authors’ analysis of the influence of structural point growth defects on the properties and technological parameters of crystals. The review is based on long-term experience with optical dielectric crystals in the laboratory where the authors of the publication work. The key conclusions are based on the au- thors’ dissertations for scientific degrees, information from reports at domestic and international conferences. The review is intended for specialists – metrologists for theoretical and applied research. In addition, the published material may be useful to teachers and students of specialized areas of higher education institutions.

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