Current State and Prospects for Improving Metrological Support in the Field of Measuring the Thickness of Coatings Using the X-ray Fluorescence Method
https://doi.org/10.20915/2077-1177-2024-20-4-103-116
Abstract
The authors were prompted to discuss the practice of using the X-ray fluorescence for measuring coating thickness in the scientific community by the high demand for the method, which is constantly growing in the Russian Federation as the high-tech sector of mechanical engineering, instrument making and electronics develops in the country.
The review presented in the article can predetermine the prospects for improving the metrological support of the X-ray fluorescence spectrometry and, more broadly, in the field of non-destructive measurements of coating thickness in general. The authors collected and systematized bibliographic material on types of coatings, methods of their application, advantages and limitations of non-destructive measurements of coating thickness. Based on these data, questions are formulated that can provide direction for scientific research aimed at developing non-destructive methods for testing coating thickness.
The published material is addressed primarily to metrologists providing control in this area and manufacturers of instruments and means for monitoring the quality of coatings. The authors allow the development of the discussion taking into account the opinion and experience of using non-destructive testing of coating thickness in the conditions of the current production.
About the Authors
M. V. Shipitsyna
UNIIM – Affiliated Branch of the D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Maria V. Shipitsyna – Leading Engineer of the Laboratory of Metrology, Thermometry and Surface Density
Researcher ID: AAD-9925–2022
4 Krasnoarmeyskaya st., Yekaterinburg, 620075
A. E. Tyurnina
UNIIM – Affiliated Branch of the D. I. Mendeleyev Institute for Metrology
Russian Federation
Russian Federation
Anasatsiya E. Tyurnina – Acting Head of the Laboratory of Metrology, Thermometry and Surface Density
4 Krasnoarmeyskaya st., Yekaterinburg, 620075
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Review
For citations:
Shipitsyna M.V., Tyurnina A.E. Current State and Prospects for Improving Metrological Support in the Field of Measuring the Thickness of Coatings Using the X-ray Fluorescence Method. Measurement Standards. Reference Materials. 2024;20(4):103-116. (In Russ.) https://doi.org/10.20915/2077-1177-2024-20-4-103-116
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