For citations:
Shipitsyna M.V., Tyurnina A.E. Current State and Prospects for Improving Metrological Support in the Field of Measuring the Thickness of Coatings Using the X-ray Fluorescence Method. Measurement Standards. Reference Materials. 2024;20(4):103-116. (In Russ.) https://doi.org/10.20915/2077-1177-2024-20-4-103-116
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