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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">rmjournal</journal-id><journal-title-group><journal-title xml:lang="ru">Эталоны. Стандартные  образцы</journal-title><trans-title-group xml:lang="en"><trans-title>Measurement Standards. Reference Materials</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2687-0886</issn><publisher><publisher-name>D. I. Mendeleyev Institute for Metrology</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.20915/2077-1177-2026-22-2-80-94</article-id><article-id custom-type="elpub" pub-id-type="custom">rmjournal-627</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Современные методы анализа веществ и материалов</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Modern methods of analysis of substances and materials</subject></subj-group></article-categories><title-group><article-title>Применение метода гидростатического взвешивания для исследования и разработки стандартных образцов толщины и поверхностной плотности металлических однослойных однокомпонентных покрытий</article-title><trans-title-group xml:lang="en"><trans-title>Application of the Hydrostatic Weighing Method for Research and Development of Reference Materials for Thickness and Surface Density of Metallic Single-layer Single-component Coatings</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-9203-9994</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Шипицына</surname><given-names>М. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Shipitsyna</surname><given-names>M. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Шипицына Мария Вячеславовна – ведущий инженер лаборатории термометрии и поверхностной плотности</p><p>620075, г. Екатеринбург, ул. Красноармейская, 4</p></bio><bio xml:lang="en"><p>Maria V. Shipitsyna – Leading Engineer ofthe Laboratory of Metrology, Thermometry andSurface Density</p><p>4 Krasnoarmeyskaya St., Yekaterinburg, 620075</p></bio><email xlink:type="simple">ShipitsynaMV@uniim.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2032-3427</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тюрнина</surname><given-names>А. Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Tyurnina</surname><given-names>A. E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Тюрнина Анастасия Евгеньевна – и. о. заведующего лабораторией термометрии и поверхностной плотности</p><p>620075, г. Екатеринбург, ул. Красноармейская, 4</p></bio><bio xml:lang="en"><p>Anastasiya E. Tyurnina – Acting Head of the Laboratory of Metrology, Thermometry and Surface Densit</p><p>4 Krasnoarmeyskaya St., Yekaterinburg, 620075</p></bio><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-6853-205X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Васильев</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Vasiliev</surname><given-names>A. S.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Васильев Александр Сергеевич – старший научный сотрудник лаборатории метрологии термометрии и поверхностной плотности</p><p>620075, г. Екатеринбург, ул. Красноармейская, 4</p></bio><bio xml:lang="en"><p>Alexander S. Vasiliev – Senior Researcher of the laboratory of metrology, thermometry and surface density</p><p>4 Krasnoarmeyskaya St., Yekaterinburg, 620075</p></bio><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>УНИИМ – филиал ФГУП «ВНИИМ им. Д. И. Менделеева»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>UNIIM – Affiliated Branch of the D. I. Mendeleyev Institute for Metrology</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2026</year></pub-date><pub-date pub-type="epub"><day>14</day><month>07</month><year>2026</year></pub-date><volume>22</volume><issue>2</issue><fpage>80</fpage><lpage>94</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Шипицына М.В., Тюрнина А.Е., Васильев А.С., 2026</copyright-statement><copyright-year>2026</copyright-year><copyright-holder xml:lang="ru">Шипицына М.В., Тюрнина А.Е., Васильев А.С.</copyright-holder><copyright-holder xml:lang="en">Shipitsyna M.V., Tyurnina A.E., Vasiliev A.S.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rmjournal.ru/jour/article/view/627">https://www.rmjournal.ru/jour/article/view/627</self-uri><abstract><p>Для поверки, калибровки и градуировки средств измерений, основанных на неразрушающих методах контроля параметров покрытий (в частности, на рентгенофлуоресцентном), необходимы стандартные образцы толщины покрытий, которые представляют собой образцы в виде диска или параллелепипеда с нанесенными на них металлическими покрытиями. Аттестованные значения толщины покрытий стандартных образцов, разработанных с помощью метода рентгенофлуоресцентного анализа, устанавливаются косвенным методом – с использованием измеренного значения поверхностной плотности и плотности материала покрытия, которое до настоящего времени в Российской Федерации и других странах являлось справочным. Однако на практике плотность материала нанесенного покрытия отличается от справочного значения, что приводит к некорректному результату определения толщины покрытий. Цель исследования – разработать стандартные образцы, аттестованная характеристика толщины покрытий которых будет установлена с использованием измеренного значения плотности материала покрытия.</p><p>С этой целью – для определения плотности покрытий – была разработана физико-математическая модель, реализующая метод гидростатического взвешивания, основанная на разности объемов образца с покрытием и без покрытия и учитывающая поправки на плотность окружающего воздуха и плотность рабочей жидкости. Экспериментальная часть выполнена на оборудовании из состава Государственного первичного эталона единиц поверхностной плотности и массовой доли элементов в покрытиях ГЭТ ­168–2015.</p><p>В результате исследования разработана, опробована и аттестована методика измерений плотности материалов покрытий в диапазоне плотности материалов покрытий (6–10) г/см3 с расширенной неопределенностью измерений плотности материалов покрытий от 0,80 до 2,6 %. Разработаны и проведены испытания в целях утверждения шести типов стандартных образцов поверхностной плотности и толщины однослойных однокомпонентных покрытий в диапазоне толщины покрытий (8–33) мкм с расширенной неопределенностью измерений толщины покрытий от 1,5 до 2,9 %.</p><p>С помощью разработанной и аттестованной методики измерений плотности материалов покрытий осуществлено метрологическое обеспечение измерений толщины однослойных покрытий с применением рентгенофлуоресцентного метода. Область применения стандартных образцов толщины и поверхностной плотности металлических однослойных однокомпонентных покрытий – научные исследования, машиностроение, приборостроение.</p></abstract><trans-abstract xml:lang="en"><p>Verification, calibration and graduation of measuring instruments based on non-destructive methods for coating parameter inspection (in particular, X-ray fluorescence) require reference materials for coating thickness. These reference materials are specimens in the form of discs or rectangular parallelepipeds with metallic coatings deposited on them. The certified values of coating thickness for reference materials developed using X-ray fluorescence analysis are established indirectly – using the measured value of surface density and the density of the coating material, which until now in the Russian Federation and other countries has been a reference value. In practice, the density of the deposited coating material differs from the reference value, which leads to incorrect determination of coating thickness.</p><p>The aim of the study is to develop reference materials whose certified coating thickness characteristic will be established using the measured value of the coating material density. For this purpose – to determine the coating density – a physical and mathematical model was developed that implements the hydrostatic weighing method, based on the difference in volume between a sample with a coating and without a coating, and taking into account corrections for the density of the ambient air and the density of the working liquid. The experimental part was carried out on equipment from the State Primary Standard of the units of surface density and mass fraction of elements in coatings GET 168–2015.</p><p>As a result of the study, a measurement procedure for the density of coating materials was developed, tested and certified in the density range of coating materials (6–10) g/cm³ with an expanded uncertainty of measurements of the density of coating materials from 0.80% to 2.6%. Six types of reference materials of surface density and thickness of single-layer single-component coatings were developed and tested for approval in the coating thickness range (8–33) µm with an expanded uncertainty of coating thickness measurements from 1.5% to 2.9%</p><p>Using the developed and certified measurement method for the density of coating materials, metrological assurance of measurements of the thickness of single-layer coatings using the X-ray fluorescence method has been implemented. The field of application of reference materials of thickness and surface density of metallic single-layer single-component coatings is scientific research, mechanical engineering and instrument engineering.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>толщина покрытий</kwd><kwd>неразрушающие методы измерений</kwd><kwd>рентгенофлуоресцентный анализ</kwd><kwd>плотность покрытий</kwd><kwd>метод гидростатического взвешивания</kwd><kwd>стандартные образцы</kwd><kwd>методика измерений</kwd></kwd-group><kwd-group xml:lang="en"><kwd>coating thickness</kwd><kwd>non-destructive measurement methods</kwd><kwd>X-ray fluorescence analysis</kwd><kwd>coating density</kwd><kwd>hydrostatic weighing method</kwd><kwd>reference materials</kwd><kwd>measurement procedure</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке УНИИМ – филиала ФГУП «ВНИИМ им. Д. И. Менделеева» (Приказ № 229 от 23.07.2024 «Об организации выполнения НИР “Метрологическое обеспечение измерений толщины покрытий с применением рентгенофлуоресцентного метода”»).</funding-statement><funding-statement xml:lang="en">The work was carried out with the financial support of UNIIM – Affiliated Branch of the D. I. Mendeleyev Institute for Metrology (Order No. 229 of July 23, 2024 On the organization of the implementation of research “Metrological support for coating thickness measurements using the X-ray fluorescence method”).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Потапов А. И., Сясько В. А. Неразрушающие методы и средства контроля толщины покрытий и изделий. Научное, методическое и справочное пособие. Санкт-Петербург : Гуманистика, 2009. 904 с.</mixed-citation><mixed-citation xml:lang="en">Potapov AI, Syas’ko VA. 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