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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">rmjournal</journal-id><journal-title-group><journal-title xml:lang="ru">Эталоны. Стандартные  образцы</journal-title><trans-title-group xml:lang="en"><trans-title>Measurement Standards. Reference Materials</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2687-0886</issn><publisher><publisher-name>D. I. Mendeleyev Institute for Metrology</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.20915/2077-1177-2024-20-4-89-102</article-id><article-id custom-type="elpub" pub-id-type="custom">rmjournal-522</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Современные методы анализа веществ и материалов</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Modern methods of analysis of substances and materials</subject></subj-group></article-categories><title-group><article-title>О применении Байесовского подхода к построению интервала охвата при ограничениях на значения измеряемой  величины</article-title><trans-title-group xml:lang="en"><trans-title>On the Application of the Bayesian Approach to Estimating the Coverage Interval of a Bounded Measurand</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-5917-1037</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Степанов</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Stepanov</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Степанов Александр Владимирович – канд. физ.-мат. наук, ведущий научный сотрудник лаборатории теоретической метрологии </p><p>190005, г. Санкт-Петербург, Московский пр., 19</p></bio><bio xml:lang="en"><p>Aleksandr V. Stepanov – Cand. Sci. (Phys. and Mat.), leading research fellow of the Laboratory of Theoretical Metrology</p><p>19 Moskovsky ave., St. Petersburg, 190005</p></bio><email xlink:type="simple">stepanov17@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-6222-5884</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Чуновкина</surname><given-names>А. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Chunovkina</surname><given-names>A. G.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Чуновкина Анна Гурьевна – д-р техн. наук, руководитель метрологического отдела</p><p>190005, г. Санкт-Петербург, Московский пр., 19</p></bio><bio xml:lang="en"><p>Anna G. Chunovkina – Doc. Sci. (Eng.), Head of the Metrology Department</p><p>19 Moskovsky ave., St. Petersburg, 190005</p></bio><email xlink:type="simple">a.g.chunovkina@vniim.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru">ФГУП «Всероссийский научно-исследовательский институт метрологии им. Д. И. Менделеева»<country>Россия</country></aff><aff xml:lang="en">D. I. Mendeleev Institute for Metrology<country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>04</day><month>01</month><year>2025</year></pub-date><volume>20</volume><issue>4</issue><fpage>89</fpage><lpage>102</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Степанов А.В., Чуновкина А.Г., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Степанов А.В., Чуновкина А.Г.</copyright-holder><copyright-holder xml:lang="en">Stepanov A.V., Chunovkina A.G.</copyright-holder><license license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://www.rmjournal.ru/jour/article/view/522">https://www.rmjournal.ru/jour/article/view/522</self-uri><abstract><p>Проблема оценивания неопределенности результатов измерений вблизи естественных границ значений измеряемых величин представляет значительный интерес для метрологов-практиков и далека от своего разрешения. В статье рассмотрен Байесовский подход к построению несимметричного интервала охвата и оцениванию неопределенности измерения в случае, когда множество возможных значений измеряемой величины ограничено. Особый интерес представляет случай, когда измеренное значение находится вблизи границы множества его возможных значений, так как построенный «традиционный» симметричный интервал, отвечающий значению коэффициента охвата, равному двум (для уровня доверия 95 %), выходит за эту границу и, как следствие, перестает обеспечивать заданный уровень доверительной вероятности.</p><p>При реализации Байесовского подхода важным исходным моментом является выбор априорной плотности распределения значений измеряемой величины. Рассмотрены четыре варианта выбора априорной плотности, включая асимметричную плотность распределения из семейства двусторонних степенны́ х распределений (TSP), даны рекомендации по их выбору и применению в зависимости от близости априорной оценки нижней границы измеряемой величины, а также измеряемого значения, к верхней границе диапазона возможных значений, относительно величины неопределенности измерения.</p><p>Разработано программное обеспечение для оценки характеристик апостериорной плотности (математического ожидания, моды и СКО) распределений значений измеряемой величины и построения кратчайших интервалов охвата, а также для вычисления уровня доверия, соответствующего «традиционному» интервалу охвата, полученному с использованием расширенной неопределенности. Применение разработанного программного обеспечения позволяет получить полную информацию о точности измерения и сделать обоснованный выбор при представлении результата измерения. Полученные результаты могут представлять интерес для метрологов-практиков при разработке и аттестации методик измерений, обработке экспериментальных данных и представлении результатов измерений при характеризации стандартных образцов, а также для специалистов, занимающихся применением методов теории вероятностей и математической статистики в решении практических задач.</p></abstract><trans-abstract xml:lang="en"><p>The problem of estimating the measurement uncertainty near the natural measurand limits is of significant interest to practicing metrologists and is far from being resolved. The article considers the Bayesian approach to constructing an asymmetric coverage interval and estimating measurement uncertainty in the case where the set of permissible values of the measured quantity is bounded. Of particular interest is the case when the measured value is located near the boundary of the set of its permissible values, since the constructed «traditional» symmetric interval corresponding to a coverage factor value of two (for a confidence level of 95 %) goes beyond the boundaries of this set and, as a consequence, do not provide the specified level of confidence probability.</p><p>When implementing the Bayesian approach, an important starting point is the choice of a priori density distribution. Four options for choosing a prior probability density are considered, including an asymmetric distribution from the family of two-sided power distributions (TSP). Recommendations are given for their selection and application depending on the proximity of the a priori estimate of the lower limit of the measured value, as well as the measured value, to the upper limit of the range of permissible values, relative to the measurement uncertainty value.</p><p>A specialized software has been developed to estimate the posterior density characteristics (expectation, mode and standard deviation) of measurand distributions and construct the shortest coverage interval, as well as to calculate the confidence level corresponding to the «traditional» coverage interval obtained using expanded uncertainty. The use of this software allows to obtain complete information about the measurement accuracy and to make an informed choice when presenting the measurement result.</p><p>The results obtained may be of interest to practicing metrologists in the development and certification of measurement techniques, processing of experimental data and presentation of measurement results when characterizing standard samples, as well as specialists involved in the application of methods of probability theory and mathematical statistics in solving practical problems.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>неопределенность измерения</kwd><kwd>интервал охвата</kwd><kwd>Байесовский подход</kwd><kwd>априорная плотность распределения</kwd><kwd>апостериорная плотность распределения</kwd></kwd-group><kwd-group xml:lang="en"><kwd>measurement uncertainty</kwd><kwd>coverage interval</kwd><kwd>Bayesian approach</kwd><kwd>prior distribution density</kwd><kwd>posterior distribution density</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Possolo A., Merkatas C., Bodnar O. 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